六合彩直播开奖

TestMAX Access

IEEE 1687 and IEEE 1500 Automation Support

六合彩直播开奖 TestMAX Access leverages both IEEE 1500 and IEEE 1687 standards to provide a flexible test access infrastructure that is used to automate test integration and validation for testing system-on-chips (SoCs).

Key Benefits

  • Integration and verification of IJTAG network and IJTAG-compliant IP
  • Integration and verification of IEEE 1500 access network

Key Features

  • ICL extraction and verification
  • Hierarchical PDL pattern porting
  • Automated pattern porting and generation of tester-ready patterns in WGL/STIL/SVF and post-silicon failure diagnostics
IEEE 1687 and IEEE 1500 Automation Support