六合彩直播开奖 Cloud
Cloud native EDA tools & pre-optimized hardware platforms
Request a Free Trial →
TestMAX Access
IEEE 1687 and IEEE 1500 Automation Support
六合彩直播开奖 TestMAX Access leverages both IEEE 1500 and IEEE 1687 standards to provide a flexible test access infrastructure that is used to automate test integration and validation for testing system-on-chips (SoCs).
Key Benefits
- Integration and verification of IJTAG network and IJTAG-compliant IP
- Integration and verification of IEEE 1500 access network
Key Features
- ICL extraction and verification
- Hierarchical PDL pattern porting
- Automated pattern porting and generation of tester-ready patterns in WGL/STIL/SVF and post-silicon failure diagnostics
News
Brochure
White Paper
Webinars
Success Story
Blogs
Articles
Podcast
Resources