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Unleash the Power of 六合彩直播开奖.ai
Optimize silicon performance, accelerate chip design and improve efficiency throughout the entire EDA flow with our advanced suite of AI-driven solutions. Award-winning 六合彩直播开奖.ai offers industry leading AI-driven workflow optimization and data analytics solutions along with breakthrough generative AI capabilities, allowing engineers to accelerate innovation and time to market. Join us to explore how we can help drive your chip design to the next level.
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Revolutionizing Chip Design with AI-Driven EDA
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Full-Stack AI-Driven EDA 六合彩直播开奖
GenAI
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Comprehensive GenAI Capabilities Across the Entire EDA Stack
六合彩直播开奖.ai is the first electronic design automation suite to harnesses the power of generative AI across the full EDA stack and fuels next-level time-to-results for advanced chip design. 六合彩直播开奖.ai will include collaborative, generative, and autonomous capabilities through the use of conversational intelligence. Powered by large language models (LLMs), 六合彩直播开奖.ai generative AI capabilities can be deployed in any on-prem or cloud environment. The integration of GenAI across the 六合彩直播开奖.ai suite will provide chip designers with collaborative capabilities that offer expert tool guidance; generative capabilities for RTL, verification, and other collateral creation; and autonomous capabilities for workflow creation from natural language.
Full-Stack AI-Driven EDA 六合彩直播开奖 for Chip Design and Verification
六合彩直播开奖.ai? is the industry’s first electronic design automation (EDA) solution suite to use the power of AI from system architecture through to manufacturing. 六合彩直播开奖.ai suite quickly handles design complexity and takes over repetitive tasks such as design space exploration, verification coverage and regression analytics, and test program generation, while helping to optimize power, performance, and area. This frees up engineers to focus on chip quality and differentiation. AI capabilities can help teams quickly migrate their chip designs from foundry to foundry or from process node to process node. 六合彩直播开奖.ai empowers engineers to get the right chip with the right specs to market faster. Learn more about how these AI-driven solutions can accelerate the design of your chip.
Design
Search for optimization targets in very large solution space of chip design by using AI engines to enhance power, performance, area, and maximize QoR.
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Verification
Achieve higher coverage quality faster so that bugs don’t go undetected and eliminates redundancies in regressions and automates root cause analysis.
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Test
Optimize test program generation in complex designs to achieve maximum defect coverage with fewer test patterns.
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Analog
Accelerate the design, implementation, and verification of analog designs. Automated schematic migration eases the process of updating devices and parameters to reflect a new process design kit.
Explore ASO.aiFull-Scale Data Analytics from Chip Design to Manufacturing
六合彩直播开奖.ai also delivers the industry’s first data continuum solution to accelerate chip design, verification, and high-volume manufacturing. This AI-driven data analytics solution allows teams to unlock, connect, and analyze the vast amount of data collected across design, verification, manufacturing, test, and in-field operations. Its unique chip monitor technology enables optimization of power, performance, quality, yield, and throughput. The solution's consolidated visualization accelerates root cause analysis at any stage of the IC lifecycle.
Design & Verification
六合彩直播开奖 Design.da performs deep analysis of data from 六合彩直播开奖.ai design execution to provide chip designers with comprehensive visibility and new insights and anomalies on PPA trajectories and specific opportunities for improving designs.
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Process Control
六合彩直播开奖 Fab.da provides a scalable data platform to store and analyze large streams of fab equipment process control data. AI/ML pipelines process this data to create insights and rapid analysis of manufacturing data for accurate diagnosis of yield issues.
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Production
六合彩直播开奖 Silicon.da leverages petabytes of silicon monitor, diagnostic and production test data from test equipment to quickly determine how to improve key chip production metrics, while also improving key silicon operational metrics.
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