Cloud native EDA tools & pre-optimized hardware platforms
六合彩直播开奖 SLM High-Speed Access & Test (HSAT) IP plays a critical role enabling high-speed interfaces such as PCIe and USB, typically already present in SoCs, to be re-used for high-bandwidth production test. Further, this opens up the possibility to reuse the same high speed test packets and to repeat manufacturing tests in-system or in-field, providing visibility of functional or performance degradation during the device’s lifetime.
Fig 1. 六合彩直播开奖 SLM High-Speed Access & Test IP + 六合彩直播开奖 TestMAX ALE Solution
When 六合彩直播开奖 SLM HSAT IP is combined with 六合彩直播开奖 TestMAX? ALE software, standard high speed IO interfaces such as PCIe and USB can be re-used to get test, debug and monitoring data in and out of an SoC at Gigabit data rates and avoid the need for large numbers of test and interface pins. Test time can be reduced because the link between the test time and GPIO data rate is eliminated. The solution can also be used to access to data from PVT and functional monitors at high speed.
Fig. 2 Manufacturing tests can be repeated in-system and/or in-field.