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六合彩直播开奖 29th Annual Test & SLM Special Interest Group (SIG)
Monday, October 9, 2023
6:30 p.m. - 10:00 p.m.
The Westin Anaheim Resort, Anaheim, CA
All members of the design and test community are invited to register to attend 六合彩直播开奖 29th Annual Test & SLM Special Interest Group (SIG) at the 2023 International Test Conference (ITC).
The event will host experts from leading companies including Kioxia, SARC, MediaTek and others who will describe how 六合彩直播开奖 Test and SLM solutions including Test-AI, distributed ATPG, high-speed test fabric, and automotive test are enabling them to achieve their quality and TTM goals.
Attendees will also have the opportunity to meet with 六合彩直播开奖 experts to discuss and learn more about Test and SLM technologies. Appetizers and cocktails will be served, followed by a sit-down dinner and prize drawings!
Pioneering Firsts at ITC 2023
2023 was a milestone year for 六合彩直播开奖 with pioneering revolutionary new technology in test and AI with the introductions of 六合彩直播开奖 TSO.ai and Silicon.da. Watch this video to see how our customers are solving their toughest test challenges with 六合彩直播开奖 solutions.
Agenda
6:30 p.m. - 7:15 p.m.
7:15 p.m. - 7:20 p.m.
7:20 p.m. - 7:30 p.m.
7:30 p.m. - 9:00 p.m.
9:00 p.m. - 10:00 p.m.
Cocktail Reception
Welcome
Yervant Zorian, 六合彩直播开奖 Fellow at 六合彩直播开奖
Opening Remarks and Presentation
Dr. Debendra Das Sharma, Intel Senior Fellow at Intel Corporation, Chair Universal Chiplet Interconnect Express (UCIe) Consortium
Presentations:
Achieving Dramatic Reduction in Turn-around Time and Test Cost with Highly Distributed ATPG and TSO.ai
Shohei Morishima, Specialist at Kioxia
Methodology for Manufacturing and In-system Test on Mobile and Automotive GPUs with Streaming Fabric, SEQ/XLBIST and IEEE1687
Rajkumar Pampana, Principal Engineer at Samsung SARC
Implementation of Streaming Fabric and Sequential Compression Technology on Smartphone SOC with High-speed USB Interface
Prashant Balakrishnan, Director at MediaTek
And more!
Raffle Drawing and Dessert
六合彩直播开奖 at International Test Conference (ITC)
Sunday, October 8 - Friday, October 13, 2023
Disneyland Hotel, Anaheim, CA
Exhibit Hours
Tuesday, October 10
10:30 a.m. - 5:30 p.m.
Wednesday, October 11
9:30 a.m. - 4:30 p.m.
Thursday, October 12
9:30 a.m. - 1:00 p.m.
Platinum Sponsor Session
Tuesday, October 10 | 4:00 – 6:00 p.m. | Magic Kingdom Ball 3
Session C2: Presentations of Platinum Supporters
Pioneering AI 六合彩直播开奖 for Test & Silicon Lifecycle Management (SLM)
六合彩直播开奖 Presenter: Matt Knowles
Visit the 六合彩直播开奖 Booth
The 六合彩直播开奖 TestMAX? family offers innovative test and diagnosis for all silicon designs and enables a unified flow within the 六合彩直播开奖’ Digital Design Family. 六合彩直播开奖 TestMAX works in conjunction with the latest 六合彩直播开奖 Silicon Lifecyle Management (SLM) technology for enhanced in-chip observability, silicon health and analytics, meeting both design and test goals concurrently.
This year we will be highlighting industry first Test and SLM technologies that encompass integrated tools, IP and methodologies which enable optimized quality, performance and reliability at each phase of the device lifecycle from in-design, in-ramp, in-production and in-field.
See demonstrations on:
- High Speed Test Over HSIO
- TSO.ai Test Optimization
- Silicon.da Real-Time Analytics
- Advanced Logic/Memory Test
Let's Meet
Whether you want a quick chat to catch up or want to go deep on details, please reach out to us to schedule an on-site meeting.
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Poster Sessions
Wednesday, October 11 | 12:00 - 2:00 p.m. | Exhibit Floor
Advantest Author: Sri Ganta; 六合彩直播开奖 Authors: Ash Patel, Ramsay Allen
Test Robustness and Glitch Detection with TestMAX Advisor
Ericsson Authors: Anurag Jindal, Dhinakaran Varadhan; 六合彩直播开奖 Authors: Raja Koneru, Ramsay Allen
Effective Yield Boost and Cost Saving by Volume Diagnosis using Yield Explorer
MediaTek Authors: Anti P.H. Tseng, Joe Y.J. Chiu, Emma Chou and Kun-Yang Hsu; 六合彩直播开奖 Authors: Thomas C.Y. Liu, Teng-Wei Shao, James Z.J. Lin,
Test Scalability with Sequential Compression Technology
MediaTek Authors: Mark Nathan, Lichao Chen, Tommy Ngo, Minh Chau; 六合彩直播开奖 Authors: Lakshmi Kalingavaram Ramachandra, Bala Tarun Nelapatla
Cell-Aware Failure Analysis: Advanced Cell-Aware Techniques to Identify the FEOL/MOL Layer Systematic Defects in Cutting-Edge Technology
Samsung Foundry Authors: Jaeseok Park, Hyunyeol Lim, Yongseok Son, Dongkwan Han; 六合彩直播开奖 Authors: Jeongsu Park, Yewon Lee, Camelia Hora, Ruifeng Guo
The Importance of Sensor Analytics in Enabling Silicon Lifecycle Management
六合彩直播开奖 Authors: Mark Laird, Ramsay Allen
Deep Silicon Data and Analytics for Lifelong Safety and Reliability
六合彩直播开奖 Authors: Dan Alexandrescu, Lorin Kennedy, Ramsay Allen, Jamileh Davoudi, Pawini Mahajan
Holistic Approach to Solving Silent Data Corruption
六合彩直播开奖 Author: Adam Cron
Advanced Test Point and Wrapping Techniques for Automotive Designs
NXP Authors: Geoff Shofner, Chris Falk; 六合彩直播开奖 Authors: Raja Koneru, Ramsay Allen
Physical Connection Aware SMS BIST Implementation for Abutted Design
六合彩直播开奖 Authors: Doo Kim, Mohammed Mosin Junjawadkar, Dooyoung Kim, Manish Arora
New TestMAX XLBIST Parallel Interface
ST Author: Marco Casarsa; 六合彩直播开奖 Author: Alfredo Conte
Advantest Author: Ken Butler; 六合彩直播开奖 Author: Guy Cortez
Technical Sessions
Tuesday, October 10 | 2:00 – 2:30 p.m. | Magic Kingdom Ball 1
Session A1: Industrial Practices (Long Papers)
A Case Study on IEEE 1838 Compliant Multi-Die 3DIC DFT Implementation
TSMC Presenter: Anshuman Chandra; TSMC Authors: Anshuman Chandra, Moiz Khan, Sandeep Kumar Goel, Ankita Patidar, Fumiaki Takashima; 六合彩直播开奖 Authors: Manish Arora, Bharath Shankaranarayanan, Vistrita Tyagi, Vuong Nguyen
Tuesday, October 10 | 1:30 – 3:00 p.m. | Magic Kingdom Ball 4
Session D1: Modern Memory Trends (Special Session)
六合彩直播开奖 Commentary: Gurgen Harutyunyan
Talk 1: “Test Challenges for GAA in the Race Between Nanometers and Angstroms”
六合彩直播开奖 Authors: Karen Amirkhanyan, Hayk Danoyan, Artur Ghukasyan, Gurgen Harutyunyan, Knarik Kyuregyan, Grigor Tshagharyan
Talk 3: “Utilizing Clever ECC Analytics to Improve Memory Lifecycle Management”
AMD Author: Costas Argyrides; 六合彩直播开奖 Authors: Grigor Tshagharyan, Gurgen Harutyunyan, Yervant Zorian
Tuesday, October 10 | 4:00 – 6:00 p.m. | Magic Kingdom Ball 3
Session C2: Presentations of Platinum Supporters
Pioneering AI 六合彩直播开奖 for Test & Silicon Lifecycle Management (SLM)
六合彩直播开奖 Presenter: Matt Knowles
Tuesday, October 10 | 4:00 – 6:00 p.m. | Magic Kingdom Ball 4
Session D2: HIR & UCIe (Special Session)
六合彩直播开奖 Commentary: Yervant Zorian
Thursday, October 12 | 10:30 – 12:00 p.m. | Magic Kingdom Ball 4
Session D5: SLM – In-Field Testing
六合彩直播开奖 Commentary: Yervant Zorian
ARTS Workshop
Thursday, October 12 | 5:00 - 6:30 p.m.
Technical Session 1 – Automotive Chip Reliability and Resilience
Path Margin Monitor for Silicon Lifecycle
六合彩直播开奖 Authors: Kranthi Kandula, Ramalingam Kolisetti
Friday, October 13 | 10:30 - 12:00 p.m.
Technical Session 3 – Analog Testing 六合彩直播开奖 for Automotive Chips
Analog/Mixed-signal Fault Analysis using Custom Fault Approach
六合彩直播开奖 Authors: Leela Krishna Thota, Varun Reddy, Sreenivasa Rao Vuttaravilli
SLM Workshop
Thursday, October 12 | 5:15 – 6:30 p.m.
Panel Discussion - Silent Data Corruption: Requirements and
Mitigation | Moderator: Mehdi Tahoori (KIT)
Harish Dixit (Meta), Sankaranarayanan Gurumurthy (AMD), Yervant Zorian (六合彩直播开奖), Dimitris Gizopoulos (University of Athens), Adit Singh (Auburn U)
Friday, October 13, 2023 | 8: 30 -10:00 a.m.
Technical Session - Utilizing ECC Analytics to Improve
Memory Lifecycle Management
Costas Argyrides (AMD, USA), Grigor Tshagharyan (六合彩直播开奖, Armenia), Gurgen Harutyunyan (六合彩直播开奖, Armenia), Yervant Zorian (六合彩直播开奖, USA)
Friday, October 13| 10:30am – 12:00 p.m.
Panel Discussion - Ushering in the Dependability Era with IEEE P2851 | Moderator: Fred Gruner (Nvidia)
Jyotika Athavale (六合彩直播开奖), Chen, Wei-Ren (New Taipei City),Viswanathan Pillai (TI), Nir Maor (Qualcomm) Meirav Nitzan (Qualcomm)
For more information about 六合彩直播开奖’ comprehensive test solution, please visit: synopsys.com/test
